We are excited to introduce our new downloadable brochure, providing comprehensive details on the x-ray diffraction (XRD) residual stress measurement method. Available on the X-ray Diffraction Method page, this essential technique is ideal for accurately determining near-surface residual stresses, offering precise results that are crucial for industries ranging from aerospace to manufacturing.
Our brochure offers an overview of how X-ray diffraction works: by using an x-ray beam to penetrate a polycrystalline material, we measure the changes in lattice spacing caused by residual stresses. The XRD residual stress measurement method allows for a residual stress profile to be generated up to a depth of 1.0 mm. This method can be conducted both in the laboratory and in the field, making it versatile for various applications.
At Hill Engineering, we pride ourselves on being industry leaders in residual stress measurement. Our state-of-the-art technology and commitment to precision ensure that our X-ray diffraction services provide you with accurate, reliable data for any project.
Download our brochure today to learn more about how we can help you optimize your materials with XRD analysis!