Hill Engineering is proud to announce that we have been awarded Canadian Patent No. 3080749, titled Analysis to Enable Stress Relief in Material Under Stress, for our DART™ near-surface residual stress measurement device.
Residual stress analysis has traditionally been limited to static, laboratory-based environments, where controlled conditions allow for precise measurements. However, performing accurate and repeatable residual stress measurements in the field has long been a challenge, often resulting in reduced accuracy and limited diagnostic value.
The newly patented DART™ technology addresses this gap by enabling highly accurate residual stress measurements using a portable, field-deployable apparatus. Designed for dynamic, non-laboratory environments, DART™ provides improved reliability over existing methods, allowing engineers to assess components directly in service conditions for the following measurement techniques:
This advancement supports better diagnostics, more informed maintenance decisions, and improved lifespan prediction.
For more information on our DART™ system and how it can be utilized to service your residual stress needs, please contact us.
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