Tag: biaxial mapping

  • HE measurement data presented at upcoming ICRS 12

    HE measurement data presented at upcoming ICRS 12

    Hill Engineering recently performed various residual stress measurements on nickel and aluminum specimens to support a project from the Materials & Processes Engineering group at Pratt & Whitney. The results will be presented by Pratt & Whitney at the International Conference on Residual Stress, happening October 20-23, 2025, in Detroit, MI. If you are planning…